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Acknowledgements
This work was supported by National Natural Science Foundation of China (Grant Nos. 61376109, 61434007). The authors would like to thank the HI-13 team and the HIRFL team for heavy ion experiment support.
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Song, R., Chen, S., Liang, B. et al. Modeling the impact of process and operation variations on the soft error rate of digital circuits. Sci. China Inf. Sci. 60, 129402 (2017). https://doi.org/10.1007/s11432-016-9001-9
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DOI: https://doi.org/10.1007/s11432-016-9001-9