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Fault diagnosis of industrial process based on the optimal parametric t-distributed stochastic neighbor embedding

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Acknowledgements

This work was supported by National Natural Science Foundation of China (Grant Nos. 61573050, 61473025), Fundamental Research Funds for the Central Universities of China (Grant No. XK1802-4), and Open-Project Grant Funded by the State Key Laboratory of Synthetical Automation for Process Industry at the Northeastern University (Grant No. PAL-N201702).

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Authors and Affiliations

  1. College of Information Science and Technology, Beijing University of Chemical Technology, Beijing, 100029, China

    Ruixue Jia, Jing Wang & Jinglin Zhou

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  1. Ruixue Jia
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  2. Jing Wang
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  3. Jinglin Zhou
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Correspondence to Jing Wang or Jinglin Zhou.

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Jia, R., Wang, J. & Zhou, J. Fault diagnosis of industrial process based on the optimal parametric t-distributed stochastic neighbor embedding. Sci. China Inf. Sci. 64, 159204 (2021). https://doi.org/10.1007/s11432-018-9807-7

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  • DOI: https://doi.org/10.1007/s11432-018-9807-7