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Industrial process fault detection based on locally linear embedded latent mapping

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Acknowledgements

This work was supported by National Natural Science Foundation of China (Grant Nos. 61490701, 61673279).

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Authors and Affiliations

  1. College of Information Engineering, Shenyang University of Chemical Technology, Shenyang, 110142, China

    Yuan Li & Chengcheng Feng

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  1. Yuan Li
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  2. Chengcheng Feng
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Correspondence to Yuan Li.

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Li, Y., Feng, C. Industrial process fault detection based on locally linear embedded latent mapping. Sci. China Inf. Sci. 65, 149201 (2022). https://doi.org/10.1007/s11432-019-2896-x

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