Conclusion
This study presents the impact of heavy ions on the SEU features and predicts the on-orbit SEU rate for the space application of high-performance 28 nm bulk SRAM-based FPGAs. The measured SEU cross sections are employed to characterize the radiation sensitivities. The results show a significant difference among the SEU cross sections of CRAMs, BRAMs, and DFFs. The employed test methods have an influence on SEU cross section results, which is verified in our application-oriented BRAM test. In addition, the radiation-sensitive resource such as the clock buffers is essential to further improve the radiation tolerance of FPGA. These results indicate that the reasonable hardening strategies are still useful for the 28 nm bulk CMOS high-performance FPGAs, which significantly promote the space application of the 28 nm high-performance FPGAs.
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Acknowledgements
The work was jointly supported by National Natural Science Foundation of China (Grant No. 11690041), State Key Laboratory of ASIC & System (Grant No. 2020KF009), and HIRFL (Grant No. JIZR20GY002).
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Cai, C., Ning, B., Fan, X. et al. SEU sensitivity and large spacing TMR efficiency of Kintex-7 and Virtex-7 FPGAs. Sci. China Inf. Sci. 65, 129402 (2022). https://doi.org/10.1007/s11432-020-3169-x
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DOI: https://doi.org/10.1007/s11432-020-3169-x