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Coverage modeling and reliability analysis using multi-state function

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Abstract

Fault tree analysis is an effective method for predicting the reliability of a system. It gives a pictorial representation and logical framework for analyzing the reliability. Also, it has been used for a long time as an effective method for the quantitative and qualitative analysis of the failure modes of critical systems. In this paper, we propose a new general coverage model (GCM) based on hardware independent faults. Using this model, an effective software tool can be constructed to detect, locate and recover fault from the faulty system. This model can be applied to identify the key component that can cause the failure of the system using failure mode effect analysis (FMEA).

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Authors and Affiliations

  1. Department of Electrical Engineering, Indian Institute of Technology Bombay, Mumbai, 400 076, India

    S. Prabhudeva & A. K. Verma

Authors
  1. S. Prabhudeva
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  2. A. K. Verma
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Corresponding author

Correspondence to S. Prabhudeva.

Additional information

Prabhudeva S. received his B.Eng. (CS&E) degree from GBDT College of Engineering, Davangere, Mysore University, in 1989, and M.Sc. degree from Birla Institute of Technology, pilani, in 1995. He is a life member of ISTE. He is currently a Ph.D. candidate at IIT Bombay, Mumbai, India.

His research interests include reliability modeling and analysis of computer based systems with dynamic behavioral conditions.

A. K. Verma received the B.Tech (Hons) and Ph.D. (Engg.) degrees from Department of Electrical Engineering, IIT Kharagpur. He has been with IIT Bombay as a faculty since 1988. He is currently a professor in reliability engineering, Department of Electrical Engineering at IIT Bombay. He has over 130 research papers to his credit and has supervised eighteen Ph.D. thesis and seventy Master_s thesis at IIT Bombay. He has been a guest editor of special issues on Quality Management of Electronics, Communications & IT of IETE Technical Review, International Journal of Performability Engineering, International Journal of Reliability, Quality and Safety Engineering, and is on the editorial board of various journals. He has been a conference chairman of various international conferences, ICQRC 2001, ICMD 2002, ICQRIT 2003, ICQRIT 2006 and a patron of ICRESH 2005. He has authored a book on Fuzzy Reliability Engineering: Concepts and Applications. He is a senior member of IEEE and life fellow of IETE.

His research interests on reliability engineering include interdisciplinary applications in software engineering, computing, maintenance, and power system.

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Prabhudeva, S., Verma, A.K. Coverage modeling and reliability analysis using multi-state function. Int J Automat Comput 4, 380–387 (2007). https://doi.org/10.1007/s11633-007-0380-1

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  • DOI: https://doi.org/10.1007/s11633-007-0380-1

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