Skip to main content
SpringerLink
Log in

Modified chain group sampling inspection plan under item failure scenario based on time truncated scheme

  • Original Article
  • Published:
International Journal of System Assurance Engineering and Management Aims and scope Submit manuscript

Abstract

A modified chain group sampling inspection plan (MChGSIP) is presented in this article where the lifetime of units follows a generalized half-normal distribution (GHND). In the present study, a brief discussion of the GHND is placed and larger the value of mean—better is the quality of the lot is considered as quality characteristic for the proposed plan. Here, we have used the two point approach: average quality level (AQL) and the limiting quality level (LQL) for the computation of plan parameters purpose. The AQL and the LQL is used to calculate all of the plan parameters in the presence of the two-point method. Aside from that, MChGSIP calculates operating characteristic values based on the values of plan parameters that are supplied. The tables that have been presented are discussed in depth. Three data sets are used to prove the significance of proposed plan in real life scenario and the only constraint of this study is that it ll helpful to the experimenter or researcher if and only if real life situation matched with behavior of GHND.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1
Fig. 2
Fig. 3
Fig. 4

Similar content being viewed by others

References

  • Al-Omari AI (2015) Time truncated acceptance sampling plans for generalized inverted exponential distribution. Electron J Appl Stat Anal 8(1):1–12

    MathSciNet  Google Scholar 

  • Al-Omari AI, Zamanzade E (2017) Double acceptance sampling plan for time truncated life tests based on transmuted generalized inverse Weibull distribution. J Stat Appl Probab 6(1):1–6

    Article  Google Scholar 

  • Al-Omari AI, Amjad D, Fatima SG (2016) Double acceptance sampling plan for time-truncated life tests based on half normal distribution. Econ Qual Control

  • Aslam M, Jun CH, Ahmad M (2009) A group sampling plan based on truncated life test for gamma distributed items. Pak J Stat 25(3):333–340

    MathSciNet  Google Scholar 

  • Aslam M, Mughal AR, Ahmad M, Yab Z (2010a) Group acceptance sampling plans for Pareto distribution of the second kind. ASTM Int 38(2):143–150

    Google Scholar 

  • Aslam M, Kundu D, Ahmed M (2010b) Time truncated acceptance sampling plans for generalized exponential distribution. J Appl Stat 37(4):555–566

    Article  MathSciNet  Google Scholar 

  • Aslam M, Jun CH, Ahmad M (2011) New acceptance sampling plans based on life tests for Birnbaum–Saunders distributions. J Stat Comput Simul 81(4):461–470

    Article  MathSciNet  Google Scholar 

  • Aslam M, Azam M, Lio Y, Jun CH (2013) Two-stage group acceptance sampling plan for Burr type X percentiles. J Test Eval 41(4):525–533

    Article  Google Scholar 

  • Baklizi A, El Masri AEK (2004) Acceptance sampling plan based on truncated life tests in the Birnbaum Saunders model. Risk Anal 24(6):1453–1457

    Article  PubMed  Google Scholar 

  • Balamurali S, Usha M (2013) Optimal designing of variables chain sampling plan by minimizing the average sample number. Int J Manuf Eng (2013)

  • Cooray K, Ananda MM (2008) A generalization of the half-normal distribution with applications to lifetime data. Commun Stat Theory Methods 37(9):1323–1337

    Article  MathSciNet  Google Scholar 

  • Dodge HF (1955) Chain sampling inspection plan. J Qual Technol 9(3):139–142

    Article  Google Scholar 

  • Govindaraju R (2006) Chain sampling. In: Pham H (ed) Springer handbook of engineering statistics. Springer, London, pp 263–279

    Chapter  Google Scholar 

  • Govindaraju K, Balamurali S (1998) Chain sampling plan for variables inspection. J Appl Stat 25(1):103–109

    Article  Google Scholar 

  • Govindaraju K, Lai CD (1998) A modified ChSP-1 chain sampling plan, MChSP-1, with very small sample sizes. Am J Math Manag Sci 18(3–4):343–358

    Google Scholar 

  • Govindaraju K, Subramani K (1993) Selection of chain sampling plans ChSP-1 and ChSP-(0.1) for given acceptable quality level and limiting quality level. Am J Math Manag Sci 13(1–2):123–136

    Google Scholar 

  • Gui W (2014) Double acceptance sampling plan for time truncated life tests based on Maxwell distribution. Am J Math Manag Sci 33(2):98–109

    Google Scholar 

  • Gui W, Xu M (2015) Double acceptance sampling plan based on truncated life tests for half exponential power distribution. Stat Methodol 27:123–131

    Article  MathSciNet  Google Scholar 

  • Gupta SS (1962) Life test sampling plans for normal and lognormal distributions. Technometrics 4(2):151–175

    Article  MathSciNet  Google Scholar 

  • Gupta SS, Groll PA (1961) Gamma distribution in acceptance sampling based on life test. J Am Stat Assoc 56(296):942–970

    Article  MathSciNet  Google Scholar 

  • Hu M, Gui W (2018) Acceptance sampling plans based on truncated life tests for Burr type X distribution. J Stat Manag Syst 21(3):323–336

    Google Scholar 

  • Kanaparthi R, Rao GS, Kalyani K, Sivakumar DCU (2016) Group acceptance sampling plans for lifetimes following an odds exponential log logistic distribution. Sri Lankan J Appl Stat 17:3

    Article  Google Scholar 

  • Lawless JF (2003) Statistical models and methods for lifetime data. Wiley, New York

    Google Scholar 

  • Luca S (2018) Modified chain sampling plans for lot inspection by variables and attributes. J Appl Stat 45(8):1447–1464

    Article  MathSciNet  Google Scholar 

  • Nichols MD, Padgett WJ (2006) A bootstrap control chart for Weibull percentiles. Qual Reliab Eng Int 22(2):141–151

    Article  Google Scholar 

  • Ramaswamy AS, Anburajan P (2012) Double acceptance sampling based on truncated life tests in generalized exponential distribution. Appl Math Sci 6(64):3199–3207

    Google Scholar 

  • Rao GS (2011a) A group acceptance sampling plans for lifetimes following a Marshall–Olkin extended exponential distribution. Appl Appl Math Int J 6(2):592–601

    MathSciNet  Google Scholar 

  • Rao GS (2011b) Double acceptance sampling plans based on truncated life tests for the Marshall–Olkin extended exponential distribution. Austrian J Stat 40(3):169–176

    Google Scholar 

  • Rosaiah K, Kantam RRL (2005) Acceptance sampling plan based on the inverse Rayleigh distribution. Econ Qual Control 20(2):77–286

    Article  Google Scholar 

  • Saha M, Tripathi H, Dey S (2021) Single and double acceptance sampling plans for truncated life tests based on transmuted Rayleigh distribution. J Ind Prod Eng 38:1–13

    Google Scholar 

  • Singh S, Tripathi YM (2017) Acceptance sampling plans for inverse Weibull distribution based on truncated life test. Life Cycle Reliab Saf Eng 6:169–178

    Article  Google Scholar 

  • Stacy EW (1962) A generalization of the gamma distribution. Ann Math Stat 1187–1192

  • Tripathi H, Dey S, Saha M (2020a) Double and group acceptance sampling plan for truncated life test based on inverse log-logistic distribution. J Appl Stat 48(7):1227–1242

    Article  MathSciNet  PubMed  PubMed Central  Google Scholar 

  • Tripathi H, Saha M, Alha V (2020b) An application of time truncated single acceptance sampling inspection plan based on generalized half-normal distribution. Ann Data Sci 1–13

  • Tripathi H, Al-Omari AI, Saha M, Alanzi ARA (2021) Improved attribute chain sampling plan for Darna distribution. Comput Syst Sci Eng 38(3):381–392

    Article  Google Scholar 

  • Tripathi H, Saha M, Dey S (2022) A new approach of time truncated chain sampling inspection plan and its applications. Int J Syst Assur Eng Manag 13(5):2307–2326

    Article  Google Scholar 

  • Tripathi H, Saha M, Dey S (2023a) A modified chain group sampling inspection plan for the time truncated life test and it’s applications. Life Cycle Reliab Saf Eng 12(1):37–49

    Article  Google Scholar 

  • Tripathi H, Saha M, Halder S (2023b) Single acceptance sampling inspection plan based on transmuted Rayleigh distribution. Life Cycle Reliab Saf Eng 1–13

  • Tsai TR, Wu SJ (2006) Acceptance sampling plan based on truncated life tests for generalized Rayleigh distribution. J Appl Stat 33(6):595–600

    Article  MathSciNet  Google Scholar 

Download references

Acknowledgements

The authors thanked the Associate Editor and the Reviewers for their very careful reading and constructive comments which helped us to improve the earlier version of this article.

Funding

This research received no external or internal funding.

Author information

Authors and Affiliations

  1. Symbiosis Statistical Institute, Symbiosis International University (Deemed), Pune, India

    Harsh Tripathi

  2. Department of Statistics, University of Delhi, Delhi, India

    Mahendra Saha

  3. Department of Statistics, Central University of Rajasthan, Ajmer, India

    Mahendra Saha

Authors
  1. Harsh Tripathi
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Mahendra Saha
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Harsh Tripathi.

Ethics declarations

Conflict of interest

No potential conflicts of interest are reported by the author(s).

Additional information

Publisher's Note

Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.

Rights and permissions

Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Tripathi, H., Saha, M. Modified chain group sampling inspection plan under item failure scenario based on time truncated scheme. Int J Syst Assur Eng Manag 15, 1305–1314 (2024). https://doi.org/10.1007/s13198-023-02221-7

Download citation

  • Received:

  • Revised:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s13198-023-02221-7

Keywords

Search

Navigation