Abstract
Testing mixed-signal circuits is a difficult task due to defect modeling challenges, observability and controllability restrictions and ATE bandwidth limitations. In this paper, the X-Y Zoning test of a Biquad filter is addressed to select the optimal excitation frequency and the best partition of the X-Y plane. Thus we obtain the best sensitivity of the BIST scheme to parametric shifts of the parameters defining the filter. The study has been particularized to shifts in the natural frequency f0 of the Biquad filter. Analytical results on the best input as well as the best partition of the observed X-Y Lissajous plots are obtained. Extensive MATLAB simulations validate the proposal, which has also been validated experimentally. For these experiments, multiple implementations of the Biquad with nominal and shifted parameters have been performed using a commercial Field Programmable Analog Array (FPAA). The experimental measures show good correlation with the analytical expressions and the simulations performed, and validate the proposed testing methodology.
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Ricard Sanahuja is Associate Professor in the Electronic Engineering Department of the Universitat Politècnica de Catalunya in Manresa (Barcelona), with teaching responsibilities in microelectronics. His current research interest is centred in Mixed-Signal Testing which offers the bases of his Ph.D. Sanahuja received his Electronic Engineering degree in 1997 from the Universitat Autònoma de Barcelona and Universitat Politècnica de Catalunya.
Victor Barcons is Associate Professor in the Electronic Engineering Department of the Universitat Politècnica de Catalunya in Manresa (Barcelona), with teaching responsibilities in analog electronics. His current research interest are in Mixed-Signal Testing and Vibration Test Control Systems. Barcons received his Industrial Engineering degree in 1994 from the Universitat Politècnica de Catalunya.
Luz Balado received the degree in Industrial Engineering in 1980 from the Universitat Politècnica de Catalunya (UPC) and the Doctor degree in Electronic Engineering in 1986. She is presently Associate Professor at the Electronic Engineering Department of the UPC where teaches Electronics and Electronic Instrumentation and is involved in its Microelectronics and Test research Group. Her main research interests are Design and Test of digital and mixed-signal circuits and defect modeling.
Joan Figueras received his Ph.D. degrees from the Universitat Politecnica de Catalunya (UPC), and the University of Michigan in Ann Arbor, Mich. where he was a Fulbright Scholar and worked in the Systems Engineering Laboratory. Currently he is Professor at the the Electronics Engineering Dpt. of the UPC in Barcelona, Spain, with teaching and research responsibilities in the area of electronics and VLSI design. His present research interests include emerging design and test techniques for high performance and low power electronic circuits. He is at present, member of the Editorial Board of the Journal of Electronic Testing (JETTA), Editor of a special issue of the IEEE Transactions on Computer Aided Design, and Chair of the European IEEE Test Technology Technical Council.
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Sanahuja, R., Barcons, V., Balado, L. et al. Testing Biquad Filters under Parametric Shifts Using X-Y Zoning. J Electron Test 21, 257–265 (2005). https://doi.org/10.1007/s10836-005-6355-7
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DOI: https://doi.org/10.1007/s10836-005-6355-7