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Improve the Quality of Per-Test Fault Diagnosis Using Output Information

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Abstract

Per-test fault diagnosis has become an effective methodology for the identification of complex defects. In this paper, we improve a recent per-test technique by applying additional diagnosis on the outputs of the circuit. The new method does not require additional information than the existing method, but incorporates more evidence to support the true defective sites by using both failing tests and failing outputs information, hence diagnosis quality can be improved. We present the procedure of the new method and give a theoretical analysis. We show that this method can very well address several drawbacks of the previous work. The experimental results on benchmark circuits demonstrate that the new method can significantly improve diagnostic quality compared to other recent results.

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Authors and Affiliations

  1. Department of Computer and Electronics Engineering, University of Nebraska-Lincoln, Omaha, NE, 68182-0572, USA

    Chunsheng Liu

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  1. Chunsheng Liu
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Correspondence to Chunsheng Liu.

Additional information

Editor: P. C. Maxwell

This work was supported in part by a faculty research fellowship and a Layman award.

A preliminary version of this paper was published in Proc. Int. Conf. on Computer Aided Design, pp 173–178, 2004.

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Liu, C. Improve the Quality of Per-Test Fault Diagnosis Using Output Information. J Electron Test 23, 11–24 (2007). https://doi.org/10.1007/s10836-006-9442-5

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  • DOI: https://doi.org/10.1007/s10836-006-9442-5

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