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Proposal of Fault Diagnosis of Analog Circuits by Combining Operation-Region Model and X–Y Zoning Method: Case Study

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Abstract

We propose a method of diagnosing analog circuits that is achieved by combining an operation-region model and an X–Y zoning method. The X–Y zoning method can be used to detect faults in analog circuits by using the relationship between circuit inputs and outputs. The operation-region model can be used to analyze/model circuit behaviors by utilizing changes in the operation regions of MOS transistors in a circuit. Operation regions are obtained from transistor node voltages at sampling time corresponding to a particular excitation of the input value and the corresponding output value. Since we developed a data processing method to handle data discretely, we could implement a procedure for diagnosis based on the preset test, which is a method of diagnosing digital circuits. We demonstrated the effectiveness of our method by applying it to ITC’97 benchmark circuits with hard and soft faults. We found that the diagnostic resolution is one for every fault.

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Authors and Affiliations

  1. Graduate School of Engineering, Tokyo Metropolitan University, 1–1 Minami-Osawa, Hachioji, Tokyo, 192-0397, Japan

    Yukiya Miura

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  1. Yukiya Miura
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Correspondence to Yukiya Miura.

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Editor: S. Mir

*This paper was presented in part at the IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004 and 2005.

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Miura, Y. Proposal of Fault Diagnosis of Analog Circuits by Combining Operation-Region Model and X–Y Zoning Method: Case Study. J Electron Test 22, 411–423 (2006). https://doi.org/10.1007/s10836-006-9456-z

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  • DOI: https://doi.org/10.1007/s10836-006-9456-z

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