Author information
Authors and Affiliations
Corresponding author
Additional information
Editor: Bruce Kim
Rights and permissions
About this article
Cite this article
Kim, B. Test Technology Newsletter April 2007. J Electron Test 23, 113–114 (2007). https://doi.org/10.1007/s10836-007-0774-6
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10836-007-0774-6