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Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST

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Abstract

In order to perform an on-chip test for characterizing both static and transmission parameters of embedded analog-to-digital converters (ADCs), this paper presents an oscillator-based reconfigurable sinusoidal signal generator which can produce both high and low frequency sinusoidal signals by switching the oscillator into different modes. Analog and digital signals can additionally be produced concurrently in both modes to provide not only test stimuli, but also reference responses for the ADC built-in self-test. The generated oscillation signal amplitude and frequency can be easily and precisely controlled by simply setting the oscillator clock frequency and initial condition coefficients. Except for a 1-bit digital-to-analog converter and smoothing filter, this proposed generator is constructed entirely by digital circuits, and hence easily integrates this silicon function and verifies itself before testing the ADCs.

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References

  1. Azais F, Bernard S, Bertrand Y, Renovell M (2000) Towards an ADC BIST scheme using the histogram test technique. Proc IEEE European Test Workshop, pp 53–58, May

  2. Baker RJ (2002) CMOS Mixed-Signal Circuit Design. IEEE Press, New York

    Google Scholar 

  3. Burns M, Roberts GW (2001) An Introduction to Mixed-Signal IC Test and Measurement. Oxford, New York

    Google Scholar 

  4. Huang JL, Ong CK, Cheng KT (2000) A BIST scheme for on-chip ADC and DAC testing. Proceedings of Design and Automation Conference, Europe, pp 216–220, Mar

  5. Ishida K, Fujishima M (2003) Chopper-stabilized high-pass sigma delta modulator utilizing a resonator structure. IEEE Trans Circuits Syst II 50:627–631 (Sep)

    Article  Google Scholar 

  6. Jin L, Parthasarathy K, Kuyel T, Chen D, Geiger RL (2006) Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal. IEEE Trans Instrum Meas 54:1188–1199 (June)

    Article  Google Scholar 

  7. Johns DA, Lewis DM (1993) Design and analysis of delta–sigma based IIR Filters. IEEE Trans Circuits Syst II 40:233–240 (Apr)

    Article  MATH  Google Scholar 

  8. Lee KJ, Chang SJ, Tzeng RS (2003) A sigma–delta modulation based BIST scheme for A/D converters. Proc IEEE Asia Test Symp 124–127 (Dec)

  9. Lu AK, Roberts GW, Jones DA (1994) A high-quality analog oscillator using oversampling D/A conversion techniques. IEEE Trans Circuits Syst II 41:437–444 (July)

    Article  MATH  Google Scholar 

  10. Oppenheim AV, Schafer RW (1999) Discrete-time signal processing. Prentice-Hall, Englewood Cliffs, NJ

    Google Scholar 

  11. Schaumann R, Valkenburg MV (2001) Design of analog filters. Oxford, New York

    Google Scholar 

  12. Silva J, Moon U, Steensgaard J, Temes GC (2001) Wideband low-distortion delta–sigma ADC topology. Electron Let 37:737–738 (June)

    Article  Google Scholar 

  13. Ting HW, Liu BD, Chang SJ (2004) A time domain built-in self-test methodology for SNDR and ENOB tests of analog-to-digital converters. Proceedings of the IEEE Asia Test Symposium, pp 52–57, Nov

  14. Ting HW, Liu BD, Chang SJ (2004) An on-chip concurrent high frequency analog and digital sinusoidal signal generator. Proceedings of the IEEE Asia-Pacific Conference on Circuits and Systems, pp 173–176, Dec

  15. Ting HW, Lin CW, Liu BD, Chang SJ (2005) Reconstructive oscillator based sinusoidal signal generator for ADC BIST. Proceedings of the IEEE Asia Solid-State Circuits Conference, pp 65–68, Nov

  16. Veillette BR, Roberts GW (1998) Delta-sigma oscillators: versatile building blocks. Int J Circuit Theory Appl 25:407–418 (Dec)

    Article  Google Scholar 

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Acknowledgment

The authors would greatly like to thank H. W. Lee for his assistance in hardware simulation and implementation of the system. In addition, they would also like to thank Professors K. J. Lee and M. D. Shieh for their helpful comments and encouragement.

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Authors and Affiliations

  1. Department of Electrical Engineering, National Cheng-Kung University, Tainan, Taiwan

    Hsin-Wen Ting, Cheng-Wu Lin, Bin-Da Liu & Soon-Jyh Chang

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  1. Hsin-Wen Ting
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  2. Cheng-Wu Lin
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  3. Bin-Da Liu
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  4. Soon-Jyh Chang
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Corresponding author

Correspondence to Hsin-Wen Ting.

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Responsible Editor: M. Lubaszewski

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Ting, HW., Lin, CW., Liu, BD. et al. Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST. J Electron Test 23, 549–558 (2007). https://doi.org/10.1007/s10836-007-5010-x

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  • DOI: https://doi.org/10.1007/s10836-007-5010-x

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