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A Design-Based Structural Test Method for a Switched-Resistor DAC

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Abstract

In this paper, a design-based structural testing method is presented to enable a fast, low cost test for a switched-resistor digital-to-analogue converter (DAC). A 24-bit stereo DAC is used to demonstrate this. After schematic-level simulations and experimental verification, it is found that the dynamic parameter THD can be predicted by the static test. Practical production wafer test and final test results evaluate this structural test method by comparing it with the traditional THD test method. In this paper the simulation results, the relevant measurement results, and the testing results are discussed. Finally, the application recommendations are given.

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Acknowledgments

We acknowledge Erik Jan Marinissen, Christoph Sarrazin and Rene Jonker at Philips Semiconductors for their good comments on this paper. We acknowledge Patrice Dumond at Philips Semiconductor Zurich, Frank Cuijper, Hoa Pham, Paul Vleugels and Tonnie Wiegman at Philips Semiconductor Nijmegen for their great supports on the final test implementation work. We acknowledge at Philips Semiconductors IMO TIC for initiating this work. This research work was one of the projects in European Medea+ program.

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Authors and Affiliations

  1. Philips Semiconductors IC Manufacturing Operations–Test Innovation Centre, Gerstweg 2, 6534 AE, Nijmegen, The Netherlands

    Lei Ma & Robert van Rijsinge

  2. Philips Semiconductors Chief Technology Office–Process Library Technology, Prof. Holstlaan 4, 5656 AA, Eindhoven, The Netherlands

    Geert Seuren, Corné Bastiaansen & Leon van der Dussen

Authors
  1. Lei Ma
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  2. Geert Seuren
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  3. Robert van Rijsinge
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  4. Corné Bastiaansen
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  5. Leon van der Dussen
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Corresponding author

Correspondence to Lei Ma.

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Responsible Editor: M. Lubaszewski

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Ma, L., Seuren, G., Rijsinge, R.v. et al. A Design-Based Structural Test Method for a Switched-Resistor DAC. J Electron Test 23, 559–567 (2007). https://doi.org/10.1007/s10836-007-5011-9

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  • DOI: https://doi.org/10.1007/s10836-007-5011-9

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