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A Module for BiST of CMOS RF Receivers

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Abstract

A module to perform a built-in self-test in CMOS RF receivers is presented. The module is associated with a test strategy consisting of measuring the main performance parameters of the single building blocks individually. Circuitry overhead, however, is kept low by using some blocks as part of the test set-up and reusing them. The test overhead has also been reduced by replacing direct determination of performance parameters with their estimation. The test methodology has been applied to a mixer in the first down conversion stage of a GSM receiver, estimating its conversion gain, 1dB compression and third-order interception points. Using the output of the IF amplifier as the only testing point, the rms errors in the estimation of the above mentioned parameters are 1.5, 3.0 and 2.7%, respectively.

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Authors and Affiliations

  1. Grup de Tecnologia Electrònica, Universitat de les Illes Balears, Cra de Valldemossa, km 7.5, 07122, Palma de Mallorca, Spain

    Kay Suenaga, Rodrigo Picos, Sebastià Bota, Miquel Roca, Eugeni Isern & Eugeni García

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  1. Kay Suenaga
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  2. Rodrigo Picos
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  3. Sebastià Bota
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  4. Miquel Roca
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  5. Eugeni Isern
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  6. Eugeni García
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Correspondence to Rodrigo Picos.

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Responsible Editor: M. Lubaszewski

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Suenaga, K., Picos, R., Bota, S. et al. A Module for BiST of CMOS RF Receivers. J Electron Test 23, 605–612 (2007). https://doi.org/10.1007/s10836-007-5051-1

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  • DOI: https://doi.org/10.1007/s10836-007-5051-1

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