Abstract
In this work, a new method to design a mixed-mode Test Pattern Generator (TPG) based only on a simple and single Linear Feedback Shift Register (LFSR) is described. Such an LFSR is synthesized by Berlekamp–Massey algorithm (BMA) and is capable of generating pre-computed deterministic test patterns which detect the hard-to-detect faults of the circuit. Moreover, the LFSR generates residual patterns which are sufficient to detect the remaining easy-to-detect faults. In this way, the BMA-designed LFSR is a mixed-mode TPG which achieves total fault coverage with short testing length and low hardware overhead compared with previous schemes according to the experimental results.
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Notes
The linear complexity of a given sequence is defined as the length of the shortest linear feedback shift register (LFSR) which can produce this sequence. The sequence linear complexity is one measure of its predictability. In a cryptographic context, if the linear complexity of a sequence s is L, then the cryptanalyst can recover the entire sequence by observing 2L consecutive elements of s [11]. Thus, stream cipher designers should ensure that sequences produced by their ciphers have large linear complexity.
It was used a kind of Monte Carlo Method to determine the circuit hard-to-detect faults. A large set of pseudo-random sequences using LFSR (almost) uniformly distributed was generated and the faults that were not detected by each sequence were checked. These faults were ranked according to the number of times that appeared as not detected. The best-ranked faults were considered hard-to-detect ones.
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de Souza, C.P., Marcos de Assis, F. & Silvério Freire, R.C. A New Built-in TPG Based on Berlekamp–Massey Algorithm. J Electron Test 26, 443–451 (2010). https://doi.org/10.1007/s10836-010-5155-x
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DOI: https://doi.org/10.1007/s10836-010-5155-x