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Assessment of Microfluidic System Testability using Fault Simulation and Test Metrics

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Abstract

In this paper we introduce a Microfluidic Fault Simulator, MFS, which uses a novel method of fault modeling and injection, the Fault Block, a generic and low abstraction fault modeling technique. This technique has been utilized over a wide range of fault conditions, in this paper we present a trapped bubble condition. In conjunction with injecting fault conditions, we can apply test methods. Two methods proving sensitive to microfluidic faults are; impedance spectroscopy and Levich electro-chemical sensors, illustrated here by a diffusional “Y” channel mixing system case study. Data from the MFS is analyzed using a Neyman-Pearson probabilistic approach, providing information on each sensor’s test capability. Overall fault coverage for a given test is determined. This approach allows the analysis of fault coverage offered by functional-test orientated sensors to be compared to alternative approaches, which potentially offer increased coverage at lower cost.

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Notes

  1. Functional Sensors refers to the use of sensors which measure a functional parameter of the system, for example, flow. Therefore, Functional Test refers to the use of this parameter to gauge whether the system is fault-free or faulty.

  2. Workstation having XP Professional Service Pack 3, AMD Phenom Quad Core 2.2 GHz Processor, 3.25 GB RAM.

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Acknowledgments

We would like to acknowledge the support given by colleagues in the Chemistry Department at the University of Hull, in particular Prof. Steve Haswell and Jane Woods.

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Correspondence to Thomas O. Myers.

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Responsible Editor: H. Stratigopoulos

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Myers, T.O., Bell, I.M. Assessment of Microfluidic System Testability using Fault Simulation and Test Metrics. J Electron Test 27, 363–373 (2011). https://doi.org/10.1007/s10836-011-5202-2

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  • DOI: https://doi.org/10.1007/s10836-011-5202-2

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