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An Optimized Seed-based Pseudo-random Test Pattern Generator: Theory and Implementation

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Abstract

This paper presents a novel seed-based test pattern generator (SB-TPG). The core of SB-TPG is a seed sequence generator. A coverage-driven seed generation algorithm has been proposed to generate the optimized seeds. The test sequence generated by SB-TPG is a single input change (SIC) sequence that can significantly reduce test power for test-per-clock built-in self-test (BIST). Further, seed-masking technique has been put forward to filter those power-consuming seeds, thus reducing test power for test-per-scan BIST. Experimental results show that SB-TPG can achieve high fault coverage with short test length, low power and small hardware overhead.

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Authors and Affiliations

  1. School of Information Engineering, Zhengzhou University, Zhengzhou, 450001, China

    Haijun Sun

  2. Department of Microelectronics, Xi’an Jiao Tong University, Xi’an, 710049, China

    Yongjia Zeng, Pu Li, Shaochong Lei & Zhibiao Shao

Authors
  1. Haijun Sun
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  2. Yongjia Zeng
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  3. Pu Li
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  4. Shaochong Lei
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  5. Zhibiao Shao
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Correspondence to Haijun Sun.

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Responsible Editor: P. Girard

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Sun, H., Zeng, Y., Li, P. et al. An Optimized Seed-based Pseudo-random Test Pattern Generator: Theory and Implementation. J Electron Test 27, 477–484 (2011). https://doi.org/10.1007/s10836-011-5232-9

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  • DOI: https://doi.org/10.1007/s10836-011-5232-9

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