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Fault Detection of Analog Circuits Using Network Parameters

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Abstract

A new method to detect component faults in analog circuits is proposed in this paper. Network parameters like driving point impedance, transfer impedance, voltage gain and current gain are used to detect component faults in analog circuits as these network parameters are sensitive to the components of the circuit. Using montecarlo simulation each component of the circuit is varied within its tolerance limit and the minimum and the maximum values of each network parameter are found for fault free circuit. At the time of testing, the network parameters are found for the injected fault and if any one or more network parameters is exceeding its predetermined bound limits then the circuit is confirmed faulty. The proposed method is validated through second order Sallenkey band pass filter and fourth order Chebyshev low pass filter circuits. Numerical results are presented to clarify the proposed method and prove its efficiency.

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References

  1. Guo Z, Savir J (2006) Coefficient based test of parametric faults in analog circuits. IEEE Trans Instrum Meas 55:150–157

    Article  Google Scholar 

  2. Kavithamani A, Manikandan V, Devarajan N (2009) Analog Circuit Fault Diagnosis Based on Bandwidth and Fuzzy Classifier. Proceedings of international conference. In: Proc. IEEE TENCON, pp. 1–6, Singapore, November 23–26, 2009

  3. Kavithamani A, Manikandan V, Devarajan N (2011) Analog circuit fault detection using location of poles. Int J Electron Test Theory Appl 27:673–678, Springer

    Article  Google Scholar 

  4. Manikandan V, Devarajan N (2007) SBT Approach towards analog circuit fault diagnosis. Active and Passive Electronic Components, Hindawi Publishing Corporation, USA, pp. 1–11, October 2007

  5. Papakostas DK, Hatzopoulos AA (2008) A unified procedure for fault detection of analog and mixed-mode circuits using magnitude and phase components of the power supply current spectrum. IEEE Trans Instrum Meas 57:2589–2595

    Article  Google Scholar 

  6. Sindia S, Singh V, Agarwal VD (2009) Polynomial Coefficient Based DC Testing of Non Linear Analog Circuits. In: Proc. Great Lakes Symp. on VLSI, pp. 69–74, May 10–12, 2009

  7. Tadeusiewicz M, Hałgas S (2006) An algorithm for multiple fault diagnosis in analogue circuits. Int J Circuit Theory Appl 34:607–615

    Article  MATH  Google Scholar 

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Correspondence to A. Kavithamani.

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Responsible Editor: K. K. Saluja

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Kavithamani, A., Manikandan, V. & Devarajan, N. Fault Detection of Analog Circuits Using Network Parameters. J Electron Test 28, 257–261 (2012). https://doi.org/10.1007/s10836-012-5284-5

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  • DOI: https://doi.org/10.1007/s10836-012-5284-5

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