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A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects

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Abstract

When testing resources are severely limited, special attention should be paid to critical faults/defects so that important or frequent field failures arising from test escapes can be minimized. We present a new algorithm to optimize test sets aimed at significantly reducing the criticality of test escapes—especially for very short test sets that may be applied in the field. The algorithm proposes an exponential-based test set quality model to evaluate the criticality of potential undetected defects and develops a programming model to search for a test set that effectively reduces this criticality.

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Acknowledgments

This work was supported in part by NSF grants CCF-1110290 and CCF-1061164.

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Authors and Affiliations

  1. Oracle Corporation, Santa Clara, CA, USA

    Yiwen Shi

  2. Southern Methodist University, Dallas, TX, USA

    Jennifer Dworak

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  1. Yiwen Shi
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  2. Jennifer Dworak
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Correspondence to Jennifer Dworak.

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Responsible Editor: M. Violante

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Shi, Y., Dworak, J. A Simulated Annealing Inspired Test Optimization Method for Enhanced Detection of Highly Critical Faults and Defects. J Electron Test 29, 275–288 (2013). https://doi.org/10.1007/s10836-013-5357-0

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  • DOI: https://doi.org/10.1007/s10836-013-5357-0

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