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Soft Fault Diagnosis of Analog Circuits via Frequency Response Function Measurements

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Abstract

This paper provides a novel method for single and multiple soft fault diagnosis of analog circuits. The method is able to locate the faulty elements and evaluate their parameters. It employs the information contained in the frequency response function (FRF) measurements and focuses on finding models of the circuit under test (CUT) as exact as possible. Consequently, the method is capable of getting different sets of the parameters which are consistent with the diagnostic test, rather than only one specific set. To fulfil this purpose, the local plolynomial approach is applied and the associated normalized FRF is developed.The proposed method is especially suitable at the pre-production stage, where corrections of the technological design are important and the diagnostic time is not crucial. Two experimental examples are presented to clarify the proposed method and prove its efficiency.

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Acknowledgements

The authors would like to thank the National Natural Science Foundation of China (Grant no. 61371049), the National Basic Research Program of China (973 Program)(Grant no. 2014CB744206), the Specialized Research Fund for the Doctoral Program of High Education of China (Grant no. 20120185110013) and Sichuan Province Applied Basic Research Project (Grant no. 2013JY0058) for their support of this research.

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Authors and Affiliations

  1. School of Automation Engineering, University of Electronic Science and Technology of China, 611731, Chengdu, China

    Yongle Xie, Xifeng Li, Xuan Xie & Qizhong Zhou

  2. Chengdu Technological University, 611730, Chengdu, China

    Sanshan Xie

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  1. Yongle Xie
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  2. Xifeng Li
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  3. Sanshan Xie
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  4. Xuan Xie
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  5. Qizhong Zhou
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Correspondence to Yongle Xie.

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Responsible Editor: K. Saluja

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Xie, Y., Li, X., Xie, S. et al. Soft Fault Diagnosis of Analog Circuits via Frequency Response Function Measurements. J Electron Test 30, 243–249 (2014). https://doi.org/10.1007/s10836-014-5445-9

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  • DOI: https://doi.org/10.1007/s10836-014-5445-9

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