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2018 JETTA-TTTC Best Paper Award

Shyue-Kung Lu, Hao-Cheng Jheng, Hao-Wei Lin and Masaki Hashizume, “Address Remapping Techniques for Enhancing Fabrication Yield of Embedded Memories,” Journal of Electronic Testing: Theory and Applications , Volume 34, Number 4, pp. 435–446, August 2018

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2018 JETTA-TTTC Best Paper Award . J Electron Test 35, 575–576 (2019). https://doi.org/10.1007/s10836-019-05834-8

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  • DOI: https://doi.org/10.1007/s10836-019-05834-8

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