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Fault isolation by test scheduling for embedded systems using a probabilistic approach

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Abstract

This paper deals with isolation of failed components in the system. Each component can be affected in a random way by failures. The state of a component or a subsystem is detected using tests. The goal of this paper is to exploit the techniques of built-in tests and available knowledge to generate the sequence of tests required to locate quickly all the components responsible for system failure. We consider an operative system according to a series structure for which we know test cost and the conditional probability that a component is responsible for the failure. The various diagnosis strategies are analyzed. The treated algorithms relay on system probabilistic analysis.

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Authors and Affiliations

  1. Département de génie mécanique, Université Laval, Sainte-Foy, QC, Canada

    Daoud Aït-Kadi & Ahmed Arous

  2. Laboratoire G-SCOP, Université Joseph Fourier, Grenoble, France

    Zineb Simeu-Abazi

Authors
  1. Daoud Aït-Kadi
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  2. Zineb Simeu-Abazi
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  3. Ahmed Arous
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Correspondence to Zineb Simeu-Abazi.

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Aït-Kadi, D., Simeu-Abazi, Z. & Arous, A. Fault isolation by test scheduling for embedded systems using a probabilistic approach. J Intell Manuf 29, 641–649 (2018). https://doi.org/10.1007/s10845-015-1088-7

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  • DOI: https://doi.org/10.1007/s10845-015-1088-7

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