Abstract
Software reliability growth models (SRGMs) incorporating the imperfect debugging and learning phenomenon of developers have recently been developed by many researchers to estimate software reliability measures such as the number of remaining faults and software reliability. However, the model parameters of both the fault content rate function and fault detection rate function of the SRGMs are often considered to be independent from each other. In practice, this assumption may not be the case and it is worth to investigate what if it is not. In this paper, we aim for such study and propose a software reliability model connecting the imperfect debugging and learning phenomenon by a common parameter among the two functions, called the imperfect-debugging fault-detection dependent-parameter model. Software testing data collected from real applications are utilized to illustrate the proposed model for both the descriptive and predictive power by determining the non-zero initial debugging process.
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A. L. Goel, K. Okumoto. Time-dependent Fault-detection Rate Model for Software and Other Performance Measures. IEEE Transactions on Reliability, vol. 28, pp. 206–211, 1979.
H. Pham. System Software Reliability, Springer Series in Reliability Engineering, Springer, London, pp.149–149, 2006.
X. Teng, H. Pham. A New Methodology for Predicting Software Reliability in the Random Field Environments. IEEE Transactions on Reliability, vol. 55, no. 3, pp. 458–468, 2006.
M. Ohba. Inflexion S-shaped Software Reliability Growth Models. Stochastic Models in Reliability Theory, S. Osaki, Y. Hatoyama (eds.), Springer-Verlag, Berlin, pp. 144–162, 1984.
H. Pham. Software Reliability Assessment: Imperfect Debugging and Multiple Failure Types in Software Development. EGandG-RAAM-10737, Idaho National Engineering Laboratory, 1993.
H. Pham. A Software Cost Model with Imperfect Debugging, Random Life Cycle and Penalty Cost. International Journal of Systems Science, vol. 27, no. 5, pp. 455–463, 1996.
M. Ohba, S. Yamada. S-shaped Software Reliability Growth Models. In Proceedings of the 4th International Conference on Reliability and Maintainability, Tregastel, France, pp 430–436, 1984.
X. Teng, H. Pham. Software Cost Model for Quantifying the Gain with Considerations of Random Field Environments. IEEE Transactions on Computers, vol. 53, no. 3, pp. 380–384, 2004.
X. Zhang, X. Teng, H. Pham. Considering Fault Removal Efficiency in Software Reliability Assessment. IEEE Transactions on Systems, Man, and Cybernetics — Part A, vol. 33, no. 1, pp. 114–120, 2003.
H. Pham, X. Zhang. NHPP Software Reliability and Cost Models with Testing Coverage. European Journal of Operational Research, vol. 145, no. 2, pp. 443–454, 2003.
H. Pham, L. Nordmann, X. Zhang. A General Imperfect Software Debugging Model with S-shaped Fault Detection Rate. IEEE Transactions on Reliability, vol. 48, no. 2, pp. 169–175, 1999.
H. Pham, X. Zhang. An NHPP Software Reliability Models and its Comparison. International Journal of Reliability, Quality and Safety Engineering, vol. 4, no. 3, pp. 269–282, 1997.
L. Pham, H. Pham. Software Reliability Models with Time-dependent Hazard Function Based on Bayesian Approach. IEEE Transactions on Systems, Man, and Cybernetics — Part A, vol. 30, no. 1, pp. 25–35, 2000.
S. Yamada, M. Ohba, S. Osaki. S-shaped Reliability Growth Modeling for Software Fault Detection. IEEE Transactions on Reliability, vol. 32, no. 5, pp. 475–484, 1983.
S. Yamada, S. Osaki. Software Reliability Growth Modeling: Models and Applications. IEEE Transactions on Software Engineering, vol. 11, no. 12, pp. 1431–1437, 1985.
S. Yamada, K. Tokuno, S. Osaki. Imperfect Debugging Models with Fault Introduction Rate for Software Reliability Assessment. International Journal of Systems Science, vol. 23, no. 12, pp. 2241–2252, 1992.
H. Pham, C. Deng. Predictive-ratio Risk Criterion for Selecting Software Reliability Models. In Proceedings of the 9th International Conference on Reliability and Quality in Design, Honolulu, Hawaii, pp. 17–21, 2003.
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Hoang Pham received the M.S. degree in statistics from the University of Illinois, Urbana Champaign, and the M.S. and Ph.D. degrees in industrial engineering from State University of New York at Buffalo. He is a professor and chairman of the undergraduate program with the Department of Industrial and Systems Engineering at Rutgers University, Piscataway, New Jersey. Before joining Rutgers, he was a senior engineering specialist with the Boeing Company, Seattle, and the Idaho National Engineering Laboratory, Idaho Falls. He is the author of two books: Software Reliability (Springer-Verlag, 2000) and System Software Reliability (Springer, 2006); the coauthor of the book: Reliability and Optimal Maintenance (Springer, 2006); the editor of the Handbook of Reliability Engineering (Springer-Verlag, 2003); and Handbook of Engineering Statistics (Springer, 2006) among many others. He is also the editor of Springer Series in Reliability Engineering and has published more than 90 journal articles, 25 book chapters, and the editor of ten volumes. He is the editor-in-chief of the International Journal of Reliability, Quality and Safety Engineering and is an editorial board member of several journals. He has been the conference chair and program chair of over 25 international conferences and workshops, and is currently the conference chair of The 13th International Conference on Reliability and Quality in Design, Seattle, 2007. He is an associate editor of IEEE Transactions on Systems, Man, and Cybernetics.
His research interests include software reliability, system reliability modeling, maintenance, and environmental risk assessment.
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Pham, H. An imperfect-debugging fault-detection dependent-parameter software. Int J Automat Comput 4, 325–328 (2007). https://doi.org/10.1007/s11633-007-0325-8
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DOI: https://doi.org/10.1007/s11633-007-0325-8