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An Efficient Critical Path Tracing Algorithm for Designing High Performance Vlsi Systems

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Abstract

Fast and correct timing verification is a critical issue in VLSIdesign. Several timing verification algorithms have been proposed in thelast few years. However, due to the huge computation time needed toeliminate false paths, existing algorithms have difficulty in performingtiming verification for large circuits. This paper presents efficientcritical path analysis algorithm based on test pattern generation with a newsensitization criterion. The algorithm does not require generation of a pathlist and elimination of false paths to find out the correct critical path ofthe circuit. The inputs which sensitize the critical path are determined aswell. The efficiency and speed of our algorithm are demonstrated using theISCAS benchmark circuits, and the critical paths are found in vastlyimproved times.

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References

  1. R.B. Hitchcock, “Timing Verification and Timing Analysis Program,” Proceedings of the 19th ACM/IEEE Design Automation Conference, 1982, pp. 594–604.

  2. J. Benkoski, E.V. Meersch, L. Claesen, and H. De Man, “Efficient Algorithms for Solving the False Path Problem in Timing Verification,” Proc Int. Conf. on Computer Aided Design (ICCAD-87), 1987, pp. 44–47.

  3. Y.C. Ju and R.A. Saleh, “Incremental Techniques for the Identification of Statically Sensitizable Critical Paths,” Proceedings of the 28th ACM/IEEE Design Automation Conference, 1991, pp. 541–546.

  4. D.H.C. Du, S.H.C. Yen, and S. Ghanta, “On the General False Path Problem in Timing Analysis,” Proceedings of the 26th ACM/IEEE Design Automation Conference, 1989, pp. 555–560.

  5. E.V. Meersch, L. Claesen, and H. De Man, “SLOCOP: A timing Verification Tool for Synchronous CMOS Logic,” Proceedings of ESSCIRC, 1986, pp. 205–207.

  6. S. Perremans, L. Claesen, and H. De Man, “Static Timing Analysis of Dynamically Sensitizable Paths,” Proceedings of the 26th ACM/IEEE Design Automation Conference, 1989, pp. 568–573.

  7. P.C. McGeer and R.K. Brayton, “Efficient Algorithms for Computing the Longest Viable Path in a Combinational Network,” Proceedings of the 26th ACM/IEEE Design Automation Conference, 1989, pp. 561–567.

  8. J.P. Roth, “Diagnosis of Automata Failures: A Calculus and a New Method,” IBM Journal of Research and Development, pp. 278–281, Oct. 1966.

  9. H. Chang and J.A. Abraham, “CHAN: An Efficient Critical Path Analysis,” Proceedings of European Design Automation Conference, 1993, pp. 444–448.

  10. ISCAS-85 Benchmarks, “Special Session: Recent Algorithms for Gate Level ATPG with Fault Simulation and Their Performance Assessment,” Proc. IEEE International Symposium on Circuits and Systems, June 1985, pp. 695–698.

  11. P. Goel, “An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits,” IEEE Transactions on Computers, Vol. C-30, No.3, pp. 215–222, March 1981.

    Google Scholar 

  12. S. Devadas, K. Keutzer, and S. Malik, “Computation of Floating Mode Delay in Combinational Circuits: Theory and Algorithm,” IEEE Transactions on Computer Aided Design, Vol. 12, No.12, pp. 1913–1922, 1993.

    Google Scholar 

  13. S. Devadas, K. Keutzer, and S. Malik, “Delay Computation in Combinational Logic Circuits: Practice and Implementation,” IEEE Transactions on Computer Aided Design, Vol. 12, No.12, pp. 1923–1936, 1993.

    Google Scholar 

  14. P.C. McGeer, A. Saldanha, P.R. Stephan, and R.K. Brayton, “Timing Analysis and Delay Fault Test Generation Using Path Recursive Functions,” Proceedings of the International Conference on Computer Aided Design, 1991, pp. 180–183.

  15. L.R. Liu, D.H.C. Du, and H.C. Chen, “An Efficient Parallel Critical Path Algorithm,” Proceedings of the 28th ACM/IEEE Design Automation Conference, 1991, pp. 535–540.

  16. H. Fujiwara and T. Shimono “On the Acceleration of Test Generation Algorithms,” IEEE Transactions on Computers, Vol. C-32, No.12, pp. 1137–1144, Dec. 1983.

    Google Scholar 

  17. H.C. Chen and D.H.C. Du, “Path Sensitization in Critical Path Problem,” IEEE Transactions on Computer Aided Design, Vol. 12, No.2, pp. 1913–1922, 1993.

    Google Scholar 

  18. S.H.C. Yen, D.H.C. Du, and S. Ghanta, “Efficient Algorithms for Extracting the K Most Critical Paths in Timing Analysis,” Proceedings of the 26th ACM/IEEE Design Automation Conference, 1989, pp. 649–654.

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Chang, H., Abraham, J.a. An Efficient Critical Path Tracing Algorithm for Designing High Performance Vlsi Systems. Journal of Electronic Testing 11, 119–129 (1997). https://doi.org/10.1023/A:1008214321624

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