Abstract
In this paper a concept is proposed to combine a bus-transfer based test approach (AMBA) with the well-known scan-test technique. This novel approach combines the advantages of modularity and core reuse (AMBA) with the benefits of high fault coverages and short time-to-market cycles (scan). The consequences with respect to test hardware implementation and tool flow are discussed.
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Feige, C., Pierick, J.T., Wouters, C. et al. Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach. Journal of Electronic Testing 14, 125–131 (1999). https://doi.org/10.1023/A:1008313726031
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DOI: https://doi.org/10.1023/A:1008313726031