Abstract
The detection of catastrophic short and open faults in bipolar current mode logic (CML) circuits is studied. The non-intrusive tests considered include functional (logic) tests, an Idd test, and a common-mode test. A 622 Mbps SONET SIPO (Serial-In/Parallel-Out) and a PISO (Parallel-In/Serial-Out) circuit form the basis of this case study.
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References
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Ivanov, A., Devdas, V. Catastrophic Short and Open Fault Detection in Bipolar CML Circuits: A Case Study. Journal of Electronic Testing 16, 631–634 (2000). https://doi.org/10.1023/A:1008325420970
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DOI: https://doi.org/10.1023/A:1008325420970