Abstract
IDDQ testing has progressed to become a worldwide accepted test method to detect CMOS IC defects. However, it is noticed that observing the average transient current can lead to improvements in real defect coverage, which is referred to IDDT testing. This letter presents a formal procedure to identify IDDT testable faults, and to generate input vector pairs to detect the faults based on Boolean process. It is interesting to note that those faults may not be detected by IDDQ or other test methods, which shows the significance of IDDT testing.
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Min, Y., Li, Z. IDDT Testing versus IDDQ Testing. Journal of Electronic Testing 13, 51–55 (1998). https://doi.org/10.1023/A:1008337200506
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DOI: https://doi.org/10.1023/A:1008337200506