Abstract
This paper describes a test method for analogue (parts of) ICs that determines whether an IC is good or not by measuring the currents flowing through its constituent circuits. The ICCQ test method is not a full functional test. It is aimed primarily at finding faulty circuits during wafer testing. Both static and dynamic currents can be tested with this test method.
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References
J.M. Soden et al., “I DDQ Testing: A Review,” J. Electronic Testing: Theory and Application, Vol. 3, pp. 291–303, 1992.
E. Bruls, “Variable Supply Voltage Testing for Analogue CMOS and Bipolar Circuits,” Proc. Int. Test Conf., 1994, pp. 262–271.
I.M. Bell et al., “Supply Current Test of Analogue and Mixed Signal Circuits,” IEE Proc.-Circuits Devices Syst., Vol. 143, No.6, pp. 399–407, Dec. 1996.
J.P.M. van Lammeren, “I CCQ: A Test Method for Analogue VLSI Based on Current Monitoring,” Digest IEEE International Workshop on I DDQ Testing (IDDQ97), 1997, pp. 24–28.
M. Soma, “Structure and Concepts for Current-Based Analog Scan,” IEEE 1995 Custom Integrated Circuits Conference, 1995, pp. 517–520.
W. Maly et al., “Built-in Current Testing,” IEEE J. Solid State Circuits, Vol. 27, pp. 425–428, March 1992.
J.P.M. van Lammeren et al., “Multi-Standard Video Front End,” IEEE Trans. Cons. El., pp. 190–196, Aug. 1991.
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Van Lammeren, J.P. ICCQ: A Test Method for Analogue VLSI Using Local Current Sensors. Journal of Electronic Testing 14, 33–38 (1999). https://doi.org/10.1023/A:1008341120580
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DOI: https://doi.org/10.1023/A:1008341120580