Abstract
This paper aims at defining an efficient test strategy for switched-current circuit testing. Taking into account the specificity of these circuits, we propose an original structural test technique as an alternative to traditionally-used functional verification. This technique is validated both at the cell and block levels. Test results demonstrate that a high fault coverage can be achieved with a low cost test procedure. A mixed strategy combining benefits of functional and structural approaches is derived.
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Renovell, M., Azaïs, F., Bodin, JC. et al. Combining Functional and Structural Approaches for Switched-Current Circuit Testing. Journal of Electronic Testing 16, 259–267 (2000). https://doi.org/10.1023/A:1008347516954
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DOI: https://doi.org/10.1023/A:1008347516954