Abstract
Gaussian aperture jitter leads to a reduction in the Signal-to-Noise-Ratio of A/D converters. Other noise sources, faults and nonlinearities also effect the digital output signal. A new off-chip diagnosis method, which systematically separates the jitter-induced errors from the errors caused by these other factors, is described. Deterministic errors are removed via a subtraction technique. High-level ADC simulations have been carried out to determine relations between the size of the jitter or decision-level noise and the remaining random errors. By carrying out two tests at two different input frequencies and using the simulation results, errors induced by decision-level noise can be removed.
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Rosing, R., Kerkhoff, H., Tangelder, R. et al. Off-Chip Diagnosis of Aperture Jitter in Full-Flash Analog-to-Digital Converters. Journal of Electronic Testing 14, 67–74 (1999). https://doi.org/10.1023/A:1008349322397
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DOI: https://doi.org/10.1023/A:1008349322397