Abstract
This paper addresses the problem of testing the configurable modules used in the local interconnect of SRAM-based FPGAs. First, it is demonstrated that a n address bit Configurable Interface Multiplexer requires N = 2n test configurations considering a stuck-at as well as a functional fault model. Second, a logic cell with a set of k input Configurable Interface Modules with n address bits is analyzed and it is proven that the set of CIMs can be tested in parallel making the number of required test configurations equal to N = 2n. Third, it is shown that the complete circuit i.e. a m × m array of sets of k Configurable Interface Multiplexers with n address bits can be tested with only N = 2n test configurations using the XOR tree and shift register structures.
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