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Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test Methodology

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Abstract

This paper describes work in progress towards the development, evaluation and validation of a structural, cost effective and quantifiable analog and mixed-signal test methodology, applicable in a production test environment and based on the application of supply current testing. To enable and support the measurements at first an analog supply current monitor was realised. The monitor offers a measurement range of 50 mA, a bandwidth of 1.5 MHz and a resolution better than 1 μA. Subsequently the monitor was used to carry out measurements on a mixed-signal Asynchronous Digital Subscriber Line (ADSL) ASIC, to evaluate the feasibility of the methodology. As these initial measurements provided very interesting results, the experiments towards the validation and quantification of the test methodology are now being repeated on a larger scale. The results gathered so far show the potential of the approach to enhance test quality combined with test cost reduction.

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References

  1. J. Van Sas, U. Swerts, and M. Darquennes, “Towards an Effective IDDQ Test Vector Selection and Application Methodology,” Proc. of the International Test Conference, Washington DC, USA, Oct. 20-25, 1996, pp. 511-520.

  2. H. Manhaeve, “IDDQ Testing, a Quality Improvement Technique,” Proceedings of the Int. Conf. On Communications, Signals and Systems AMSE-CSS96, Brno, Czech Republic, 10-12 Sept. 1996, pp. xxix-xxxviii (invited paper).

  3. A. Richardson, A. Bratt, I. Baturone, and J.L. Huertas, “The Application of IDDX Test Strategies in Analogue and Mixed Signal IC's,” International Mixed Signal Testing Workshop, June 1995, pp. 206-211.

  4. I.M. Bell, and S.J. Spinks, “Evaluation and Comparison of Supply Current Test and other Structural Test Methodologies for Analogue and Mixed Signal Circuits,” Compendium of Papers of the IEEE Hot Topic Workshop on Current Testing for Analogue and Mixed Signal Devices CTAMS98, Paris, France, 27 Feb. 1998, pp. 24-30.

  5. M. Sidiropulos, V. Stopjakova, H. Manhaeve, and V. Musil, “Concurrent IDDX Monitoring for Analog Self-Test,” Proceedings of the IEEE European Test Workshop ETW97, Cagliari, Italy, 28-30 May 1997.

  6. M. Sidiropulos, V. Stopjakova, H. Manhaeve, and V. Musil, “Practical Evaluation of an Analogue Self-Test Technique,” Compendium of Papers of the IEEE Hot Topic Workshop on Current Testing for Analogue and Mixed Signal Devices CTAMS98, Paris, France, 27 Feb. 1998, pp. 31-38.

  7. W.M. Lindermeir, T.J. Vogels, and H.E. Graeb, “Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults,” Proceedings of the Design, Automation and Test in Europe Conference DATE'98, Paris, France, 23-26 Feb. 1998, pp. 822-829.

  8. M. Sidiropulos, V. Musil, and H. Manhaeve, “Alternative Methodology for Dynamic IDD Testing,” Proceedings of the 5th Electronic Devices and Systems Conference 1998 EDS98, Brno, Czech Republic, 11-12 June 1998, pp. 84-85.

  9. H. Manhaeve, P. Wrighton, J. Van Sas, and U. Swerts, “An Off-chip IDDQ Current Measurement Unit for Telecommunication ASICs,” Proceedings of the International Test Conference, Washington DC, USA, Oct. 2-6, 1994, pp. 203-212.

  10. Y. Maidon, and H. Manhaeve, “Existing Current Monitors and their Application for Analogue and Mixed Signal Testing,” Compendium of Papers of the IEEE Hot Topic Workshop on Current Testing for Analogue and Mixed Signal Devices CTAMS98, Paris, France, 27 Feb. 1998, pp. 2-15.

  11. Y. Maidon, Y. Deval, and H. Manhaeve, “Off Chip Monitors and Built In Current Sensors for Analogue and Mixed Signal Testing,” Proceedings of the IEEE International Workshop on IDDQ Testing IDDQ98, San Jose, California, USA, 12-13 Nov. 1998, pp. 59-63.

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Authors and Affiliations

  1. Q-Star Test nv. Lieven, Bauwensstraat 20, B-8200, Brughe, Belgium

    H. Manhaeve

  2. Switching Systems Division, Design Departement VA21, Alcatel, F. Wellesplein 1, B-2018, Antwerp, Belgium

    J. Verfaillie & B. Straka

  3. Switching Systems Division, Design Departement VA21, Alcatel, F. Wellesplein 1, B-2018 Antwerp, Belgium

    J.P. Cornil

Authors
  1. H. Manhaeve
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  2. J. Verfaillie
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  3. B. Straka
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  4. J.P. Cornil
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Manhaeve, H., Verfaillie, J., Straka, B. et al. Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test Methodology. Journal of Electronic Testing 16, 227–234 (2000). https://doi.org/10.1023/A:1008387214228

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