Abstract
In this paper we introduce a new measure for target fault selection and backtrace during test generation. The measure incorporates information on undetected faults and hence attempts to maximize the number of additional faults that may be detected by each test vector. Experimental results show the usefulness of this heuristic and demonstrate its superiority over the use of the SCOAP measure.
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Le, K.T., Saluja, K.K. A Heuristic Measure to Maximize Detected Faults per Test. Journal of Electronic Testing 13, 57–60 (1998). https://doi.org/10.1023/A:1008389217344
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DOI: https://doi.org/10.1023/A:1008389217344