Abstract
This paper presents a novel scheme to diagnose single and double faults for linear analog circuits. The scheme first proposes a simple transformation procedure to transform the tested linear analog circuit into a discrete signal flow graph, then constructs “diagnosing evaluators,” which model the faulty components, to form a diagnosis configuration to diagnose the faults through digital simulation. This saves much computation time. Furthermore, a simple method to un-power OP's is also proposed to differentiate equivalent faults. The scheme can diagnose faults in passive components as well as active faults in OP's.
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Lin, J.W., Lee, C.L., Su, C.C. et al. Fault Diagnosis for Linear Analog Circuits. Journal of Electronic Testing 17, 483–494 (2001). https://doi.org/10.1023/A:1012816621144
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DOI: https://doi.org/10.1023/A:1012816621144