Abstract
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital combinational circuits. These noise effects can propagate through a circuit and create a logic error in a latch or at a primary output. We have developed a mixed-signal test generator, called XGEN, that incorporates classical static values as well as dynamic signals such as transitions and pulses, and timing information such as signal arrival times, rise/fall times, and gate delay. In this paper we first discuss the general framework of the test generation algorithm followed by computational results. Comparison of results with SPICE simulations confirms the accuracy of this approach.
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Chen, WY., Gupta, S.K. & Breuer, M.A. Test Generation for Crosstalk-Induced Faults: Framework and Computational Results. Journal of Electronic Testing 18, 17–28 (2002). https://doi.org/10.1023/A:1013771821826
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DOI: https://doi.org/10.1023/A:1013771821826