Abstract
This paper presents a design for testability (DFT) technique for testing high-speed circuits with a low-speed test mode clock. With this technique, the test mode clock frequency can be reduced with virtually no lower limit. Even with the reduced speed requirement on the automatic test equipment (ATE), our method facilitates the test of the rated-speed timing and allows performance binning. A CMOS implementation of the DFT hardware with 50 ps timing accuracy is presented. To demonstrate the effectiveness of the technique we designed a 16-bit, 1.4 GHz pipelined multiplier as a test vehicle. Simulations using a test clock frequency much lower than the rated clock frequency show that delay faults of sizes as small as 50 ps are detected and that the new test technique provides correct performance binning.
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Nummer, M., Sachdev, M. A DFT Technique for Testing High-Speed Circuits with Arbitrarily Slow Testers. Journal of Electronic Testing 19, 299–314 (2003). https://doi.org/10.1023/A:1023753231177
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DOI: https://doi.org/10.1023/A:1023753231177