Abstract
Greedy scheduling algorithms are proposed here to improve the test concurrency under power limits. An extended tree growing technique is used to model the power-constrained test scheduling problem in these algorithms. A constant additive model is employed for power dissipation analysis and estimation. The efficiency of this approach is assessed with test scheduling examples and the experimental results are presented. Known list scheduling approaches are proven to give acceptable power-constrained test scheduling results quickly, but not guaranteed to be optimal.
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Mureşan, V., Wang, X., Mureşan, V. et al. Greedy Tree Growing Heuristics on Block-Test Scheduling Under Power Constraints. Journal of Electronic Testing 20, 61–78 (2004). https://doi.org/10.1023/B:JETT.0000009314.39022.78
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DOI: https://doi.org/10.1023/B:JETT.0000009314.39022.78