Abstract
We discuss the design of a novel analog checker that monitors two duplicate signals and provides a digital error indication when their absolute difference is unacceptably large. The key feature of the proposed checker is that it establishes a test criterion that is dynamically adapted to the magnitude of its input signals, thus enhancing the accuracy of assessing their relative discrepancy. Consequently, when this checker is utilized in concurrent error detection, it diminishes the probability of both false negatives and false positives. Likewise, when employed for off-line test purposes, the checker supports both high yield and high fault coverage. In contrast, checkers implementing a static test criterion may only be tuned to achieve efficiently one of the aforementioned objectives.
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Stratigopoulos, HG.D., Makris, Y. An Analog Checker with Input-Relative Tolerance for Duplicate Signals. Journal of Electronic Testing 20, 479–488 (2004). https://doi.org/10.1023/B:JETT.0000042512.77744.d5
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DOI: https://doi.org/10.1023/B:JETT.0000042512.77744.d5