1 July 2008 Segmentation and classification of anomalies in periodic structures
Yannick Caulier, Klaus P. Spinnler, Thomas M. Wittenberg, Salah Bourennane
Author Affiliations +
Abstract
An alternative solution for surface inspection is being presented. It is based on a concerted combination of an adapted stripe-illumination principle together with an image processing approach specialized on the analysis of the obtained stripe images. This approach is capable of detecting, segmenting, and classifying nondefective surfaces, as well as three- and two-dimensional defective surfaces from perturbations in the stripe illumination. In contrast to alternative procedures, no calibration of illumination or camera is necessary. The principle of the proposed method using a concrete industrial application for the inspection of cylindrical metallic surfaces under structured lighting is explained. Furthermore, based on several examples involving different surface types, we demonstrate the broad range of applications for the proposed algorithm.
©(2008) Society of Photo-Optical Instrumentation Engineers (SPIE)
Yannick Caulier, Klaus P. Spinnler, Thomas M. Wittenberg, and Salah Bourennane "Segmentation and classification of anomalies in periodic structures," Journal of Electronic Imaging 17(3), 033014 (1 July 2008). https://doi.org/10.1117/1.2954127
Published: 1 July 2008
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Cited by 1 scholarly publication.
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KEYWORDS
Inspection

Image segmentation

3D image processing

Image classification

Cameras

Sensors

Image processing

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