Paper
13 April 2001 Surface characterization using confocal microscopy and wavelet transform analysis
Mouade Bouydain, Jose F. Colom, Joan Anto, Josep Mallofre Pladellorens
Author Affiliations +
Proceedings Volume 4298, Three-Dimensional Image Capture and Applications IV; (2001) https://doi.org/10.1117/12.424905
Event: Photonics West 2001 - Electronic Imaging, 2001, San Jose, CA, United States
Abstract
The traditional paper surface characterisation methods, for example based on air-stream leakage (Bendtsen, Parker print surf), are facing severe limitations. These traditional methods are better suited as indicators of erroneous production than for grading paper samples with respect to his print quality potential. It has been acknowledged that this research problem cannot be addressed without taking the papers three-dimensional structure into account. In this work, we will use a confocal image of the surface of the paper, obtained by imaging either a pinhole or a structured light pattern by a very high numerical aperture optical system on the surface of paper to be measured. In order to analyse the 3D image of the paper we perform a multiresolution analysis. This means that a given signal is decomposed at a coarse approximation plus added details. Applying the successive approximations recursively makes the approximation error go to zero. Using multiresolution analysis and orthonormal wavelet bases, we can construct an algorithm using wavelets. That will allow us to characterise the surface of the paper and grading paper samples with respect to his print quality potential.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mouade Bouydain, Jose F. Colom, Joan Anto, and Josep Mallofre Pladellorens "Surface characterization using confocal microscopy and wavelet transform analysis", Proc. SPIE 4298, Three-Dimensional Image Capture and Applications IV, (13 April 2001); https://doi.org/10.1117/12.424905
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KEYWORDS
Wavelets

Confocal microscopy

Image analysis

3D image processing

3D acquisition

Wavelet transforms

3D metrology

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