Paper
15 July 2004 Pattern matching by scan-converting polygons
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Abstract
Pattern matching is one of the well-known pattern recognition techniques. When using points as matching features, a pattern matching problem becomes a point pattern matching problem. This paper proposes a novel point pattern matching algorithm that searches transformation space by transformation sampling. The algorithm defines a constraint set (a polygonal region in transformation space) for each possible pairing of a template point and a target point. Under constrained polynomial transformations that have no more than two parameters on each coordinate, the constraint sets and the transformation space can be represented as Cartesian products of 2D polygonal regions. The algorithm then rasterizes the transformation space into a discrete canvas and calculates the optimal matching at each sampled transformation efficiently by scan-converting polygons. Preliminary experiments on randomly generated point patterns show that the algorithm is effective and efficient. In addition, the running time of the algorithm is stable with respect to missing points.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mingtian Ni and Stephen E. Reichenbach "Pattern matching by scan-converting polygons", Proc. SPIE 5438, Visual Information Processing XIII, (15 July 2004); https://doi.org/10.1117/12.543057
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Cited by 4 scholarly publications.
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KEYWORDS
Detection and tracking algorithms

Distance measurement

Liquid crystals

Pattern recognition

Algorithm development

Nickel

Visualization

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