Optimal patch code design via device characterization

Wencheng Wu; Edul N. Dalal

doi:10.1117/12.905668

24 January 2012 Optimal patch code design via device characterization

Wencheng Wu, Edul N. Dalal

Proceedings Volume 8293, Image Quality and System Performance IX; 829311 (2012) https://doi.org/10.1117/12.905668
Event: IS&T/SPIE Electronic Imaging, 2012, Burlingame, California, United States

Abstract

In many color measurement applications, such as those for color calibration and profiling, "patch code" has been used successfully for job identification and automation to reduce operator errors. A patch code is similar to a barcode, but is intended primarily for use in measurement devices that cannot read barcodes due to limited spatial resolution, such as spectrophotometers. There is an inherent tradeoff between decoding robustness and the number of code levels available for encoding. Previous methods have attempted to address this tradeoff, but those solutions have been sub-optimal. In this paper, we propose a method to design optimal patch codes via device characterization. The tradeoff between decoding robustness and the number of available code levels is optimized in terms of printing and measurement efforts, and decoding robustness against noises from the printing and measurement devices. Effort is drastically reduced relative to previous methods because print-and-measure is minimized through modeling and the use of existing printer profiles. Decoding robustness is improved by distributing the code levels in CIE Lab space rather than in CMYK space.

Citation Download Citation

Wencheng Wu and Edul N. Dalal "Optimal patch code design via device characterization", Proc. SPIE 8293, Image Quality and System Performance IX, 829311 (24 January 2012); https://doi.org/10.1117/12.905668

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