The research of design mode selection based on test first

Shoubai Xiao; Qinghua Zhan

doi:10.1117/12.968558

8 June 2012 The research of design mode selection based on test first

Shoubai Xiao, Qinghua Zhan

Proceedings Volume 8334, Fourth International Conference on Digital Image Processing (ICDIP 2012); 833441 (2012) https://doi.org/10.1117/12.968558
Event: Fourth International Conference on Digital Image Processing (ICDIP 2012), 2012, Kuala Lumpur, Malaysia

Abstract

The 23 GOF design patterns are proven to be effective against changes in demand, but the the abuse of design patterns phenomenon are common because of human chase blindly. The abuse of model application invirtually increases the difficulties of code maintenance, and is more harmful than non-usage any design patterns. In this paper, one method of "the choose of design patterns according to test first " is advocated to use design patterns rationally by the way of nonusage any design patterns.

Citation Download Citation

Shoubai Xiao and Qinghua Zhan "The research of design mode selection based on test first", Proc. SPIE 8334, Fourth International Conference on Digital Image Processing (ICDIP 2012), 833441 (8 June 2012); https://doi.org/10.1117/12.968558

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