Paper
8 June 2012 Face recognition using improved local line binary pattern
Wuh Shing Chai, Bakhtiar Affendi Rosdi, Shahrel Azmin Suandi
Author Affiliations +
Proceedings Volume 8334, Fourth International Conference on Digital Image Processing (ICDIP 2012); 833445 (2012) https://doi.org/10.1117/12.968566
Event: Fourth International Conference on Digital Image Processing (ICDIP 2012), 2012, Kuala Lumpur, Malaysia
Abstract
This paper presents a new technique, named Improved Local Line Binary Pattern (ILLBP), which is an operator for illumination-robust face recognition from a single training image. In order to empirically demonstrate effectiveness of the proposed approach, we use Principal Component Analysis-Nearest Neighbour (PCA-NN) and multi-class Support Vector Machine (SVM) as the classifiers. Comparisons to the Local Line Binary Pattern (LLBP) on Yale Face Database B are also conducted. The advantages of our technique include higher accuracy, lesser complexity and faster computational time compared to LLBP technique.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wuh Shing Chai, Bakhtiar Affendi Rosdi, and Shahrel Azmin Suandi "Face recognition using improved local line binary pattern", Proc. SPIE 8334, Fourth International Conference on Digital Image Processing (ICDIP 2012), 833445 (8 June 2012); https://doi.org/10.1117/12.968566
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KEYWORDS
Binary data

Facial recognition systems

Databases

Image processing

Image analysis

Image resolution

Light sources and illumination

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