Skip to main content
Log in

Modeling of radiation sensitivity of hydrogen sensors based on MISFET

  • Sensors and Systems
  • Published:
Automation and Remote Control Aims and scope Submit manuscript

Abstract

The paper presents the electrophysical and electrical models of hydrogen and radiation sensitivities of the integrated sensors with MISFET sensing elements based on the structure Pd–Ta2O5–SiO2–Si. The models take into account the influence of electrical circuits and modes, chip temperatures, surface-state density and radiation parameters on the hydrogen sensitivity of the sensors.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. Nikiforova, M.Yu. and Podlepetsky, B.I., Integrated Gas Concentration Sensors, Datch. Sist., 2002, no. 4, pp. 38–53.

    Google Scholar 

  2. Lundström, I., Hydrogen Sensitive MOS-Structures, Part I: Principles and Applications, Sens. Actuat., 1981, no. 1, pp. 423–426.

    Google Scholar 

  3. Podlepetsky, B.I., Integrated Semiconductor Sensors for Small Concentration Measurement of Hydrogenous Gases, CHIP NEWS, 1997, no. 3, pp. 26–27.

    Google Scholar 

  4. Voronov, Yu.A., Kovalenko, A.V., Nikiforova, M.Yu., et al, Elements of Gas Sensors Based on Microfabrication Technology, Datch. Sist., 2010, no. 3, pp. 28–36.

  5. Podlepetsky, B.I., Performance Modeling of Integrated Hydrogen Sensors Based on MIS Transistor Sensing Elements, Datch. Sist., 2014, no. 7, pp. 2–11.

    Google Scholar 

  6. Podlepetsky, B.I., Nikiforova, M.Yu., and Gumenyuk, S.V., The Influence of Optical Radiation on Integrated Hydrogen Sensor Response Parameters, Izv. Vuzov. Elektron., 2002, no. 6, pp. 44–47.

    Google Scholar 

  7. Podlepetsky, B.I., The Influence of Ionizing Radiation on the Characteristics of Integrated Hydrogen Sensors with MIS-Transistor Sensitive Elements, Datch. Sist., 2011, no. 6, pp. 35–41.

    Google Scholar 

  8. Patrikeev, L.N., Podlepetsky, B.I., and Popov, V.D., Charge Formation in SiO2 under MOS-Structure Exposure to Radiation in a Reactor, Mikroelektron., 1973, no. 1, pp. 7–9.

    Google Scholar 

  9. Patrikeev, L.N., Podlepetsky, B.I., and Popov, V.D., Variation of Insulator Charge and MIS-Structure Conductivity under the Influence of Radiation, Mat. vses. konf. “Fizika dielektrikov i perspektivy ee razvitiya” (Proc. All-Union Conf. “Physics of Insulators and Its Development Prospects”), 1973, Leningrad: LPI, vol. 3, pp. 226–227.

    Google Scholar 

  10. Kozlov, Yu.G., Patrikeev, L.N., and Podlepetsky, B.I., The Influence of Insulator-Embedded Ions of Boron and Phosphorus on the Sensitivity of Al–SiO2–Si Structure to radiation, Mikroelektronika, 1975, vol. 4, no. 5, pp. 17–20.

    Google Scholar 

  11. Patrikeev, L.N., Podlepetsky, B.I., and Popov, V.D., Radiatsionnaya stoikost’ poluprovodnikovykh priborov i integral’nykh skhem (Radiation Resistance of Semiconductor Devices and Integrated Circuits), Moscow: MIFI, 1975.

    Google Scholar 

  12. Pershenkov, V.S., Popov, V.D., and Shal’nov, A.V., Poverkhnostnye radiatsionnye effekty v elementakh integral’nykh mikroskhem (Surface Radiation Effects in Integrated-Circuit Elements), Moscow: Energoatomizdat, 1988.

    Google Scholar 

  13. Pershenkov, V.S., Skorobogatov, P.K., and Ulimov, V.N., Dozovye effekty v izdeliyakh sovremennoi mikroelektroniki (Dose Effects in Modern Microelectronic Devices), Moscow: MIFI, 2011.

    Google Scholar 

  14. Gerasimov, A.B., Aigina, N.R., Ushangishvili, L.I., and Shilo, A.G., Radiation-Resistive MOS Integrated Circuits: Technological Aspects of Creation, Zarubezhn. Elektronn. Tekh., 1979, no. 1, pp. 3–47.

    Google Scholar 

  15. Lavrentsov, V.D., Khorokhina, L.N., and Yusov, Yu.P., The Operability of MIS Devices under the Influence of Ionizing Radiation in RealWorking Conditions, Zarubezhn. Elektronn. Tekh., 1991, nos. 1–2, pp. 3–100.

    Google Scholar 

  16. Zebrev, G.I., Fizicheskie osnovy kremnievoi nanoelektroniki: uchebnoe posobie (Physical Foundations of Silicon Nanoelectronics: A Textbook), Moscow: BINOM, 2011.

    Google Scholar 

  17. Podlepetsky, B.I., Kovalenko, A.V., Kurakin, D.A., et al., The Influence of Electrical Modes of MISFIT Sensitive Elements on Hydrogen Sensor Characteristics, Datch. Sist., 2014, no. 12, pp. 39–45.

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to B. I. Podlepetsky.

Additional information

Original Russian Text © B.I. Podlepetsky, 2015, published in Datchiki i Sistemy, 2015, No. 1, pp. 60–71.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Podlepetsky, B.I. Modeling of radiation sensitivity of hydrogen sensors based on MISFET. Autom Remote Control 77, 1301–1315 (2016). https://doi.org/10.1134/S0005117916070171

Download citation

  • Received:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S0005117916070171

Navigation