Drechsler, Rolf. "Testing integrated circuits: A special issue on the occasion of the 60th birthday of Prof. Dr. Bernd Becker"
it - Information Technology, vol. 56, no. 4, 2014, pp. 148-149.
https://doi.org/10.1515/itit-2014-1043Drechsler, R. (2014). Testing integrated circuits: A special issue on the occasion of the 60th birthday of Prof. Dr. Bernd Becker.
it - Information Technology,
56(4), 148-149.
https://doi.org/10.1515/itit-2014-1043Drechsler, R. (2014) Testing integrated circuits: A special issue on the occasion of the 60th birthday of Prof. Dr. Bernd Becker. it - Information Technology, Vol. 56 (Issue 4), pp. 148-149.
https://doi.org/10.1515/itit-2014-1043Drechsler, Rolf. "Testing integrated circuits: A special issue on the occasion of the 60th birthday of Prof. Dr. Bernd Becker"
it - Information Technology 56, no. 4 (2014): 148-149.
https://doi.org/10.1515/itit-2014-1043Drechsler R. Testing integrated circuits: A special issue on the occasion of the 60th birthday of Prof. Dr. Bernd Becker.
it - Information Technology. 2014;56(4): 148-149.
https://doi.org/10.1515/itit-2014-1043Copied to clipboard
