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Published Online: 1988-04
Published in Print: 1988-04
© 2013 Oldenbourg Wissenschaftsverlag GmbH, Rosenheimer Str. 145, 81671 München
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Testfreundlichkeit und Fehlertoleranz in VLSI-Systemen / Testability and Fault Tolerance in VLSI-Systems
From the journal it - Information Technology
