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The synthesis of probability tests with a small number of kits

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Abstract

In the present paper, the analysis of controlled probability tests is carried out and the basic criteria for their synthesis, including the Hamming and Cartesian distance, are given. The identity of the synthesis procedures of the controlled probability tests based on the greedy algorithm is shown, and the optimum probability test synthesized according to the given algorithm is given. A universal characteristic of the efficiency of the probability tests used for the synthesis of tests with a small number of kits is proposed. An algorithm of the synthesis of such tests is considered, and examples of such tests with the assessment of their efficiency are presented.

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References

  1. Appelo, D., et al., On the Automation of the Test Flow of Complex SoCs, Proc. IEEE VLSI Test Symposium (VTS 2006), Berkeley, USA, 2006, pp. 166–171.

  2. Petersen, K., Oberg, J., and Magnhagen, B., Towards an almost C-Testable NoC Test Strategy, Proc. East-West Design and Test Symp. (EWDTS’07), Kharkov, Ukraine, 2007, pp. 126–132.

  3. Yarmolik, S.V. and Yarmolik, V.N., Multiple Nondestructive March Tests with Changeable Address Sequences, Avtomat. Telemekh., 2007, no. 4, pp. 126–137.

  4. Yarmolik, S.V., Kurbatskii, A.N., and Yarmolik, V.N., Determination of the Optimal Initial States for Multiple-Run RAM Testing, Avtomat. Vychisl. Tekhn., 2008, no. 3, pp. 15–23 [Aut. Cont. Comp. Sci. (Engl. Transl.) 2008, vol. 42, no. 3, pp. 120–125].

  5. Yarmolik, S.V., Zankovich, A.P., and Ivanyuk, A.A., Marshevye testy dlya samotestirovaniya OZU (March Tests for RAM Self-Testing), Minsk: Izdatel’skii tsentr BGU, 2009.

    Google Scholar 

  6. Karpovsky, M.G., Yarmolik, V.N., and Goor, A.J., Pseudo-Exhaustive Word-Oriented DRAM Testing, Proc. Eur. Conf. on Design and Test (ED&TC), Paris, 1995, pp. 126–132.

  7. Shiyi, Xu., Orderly Random Testing for Both Hardware and Software Proc. Pacific Rim Int. Symp. on Dependable Computing, Gold Coast, Australia, 2008, pp. 160–167.

  8. Zhou, Z.Q., Using Coverage Information to Guide Test Case Selection in Adaptive Random Testing, Proc. 34th IEEE Comp. Software and Appl. Conf., Seoul, 2010, pp. 208–213.

  9. Wu, S.H., Jandhyala, S., Malaiya, Y.K., and Jayasumana, A.P., Antirandom Testing: A Distance-Based Approach, VLSI Design, 2008, no. 2, pp. 1–9.

  10. Jiang, B., Zhang, Z., Chan, W.K., and Tse, T.H., Adaptive Random Test Case Prioritization, Proc. IEEE/ACM Int. Conf. on Automated Software Engineering. Auckland, New Zealand, 2009, pp. 233–244.

  11. Chen, T.Y., Kuo, F.-C., Merkel, R.G., and Tse, H.T., Adaptive Random Testing: The ART of Test Case Diversity, J. Syst. Software, 2010, vol. 83, no. 1, pp. 60–66.

    Article  Google Scholar 

  12. Malaiya, Y.K. and Yang, S., The Coverage Problem for Random Testing, Proc. IEEE ITC, Las Vegas, USA, 1984, pp. 237–242.

  13. Das, D. and Karpovsky, M.G., Exhaustive and Near-Exhaustive Memory Testing Techniques and Their BIST Implementations, J. Electr. Testing: Theory and Applications, 1997, vol. 10, pp. 215–229.

    Article  Google Scholar 

  14. Kulyamin, V.V., Combinatorial Analysis of Words and Construction of Test Sequences, Tr. Inst. Sist. Program. Ross. Akad. Nauk, 2004, no. 8(1), p. 25.

  15. Peterson, W.W. and Weldon, E.J., Error-Correction Codes, Cambridge: The MIT Press, 1972.

    Google Scholar 

  16. Malaiya, Y.K. and Yang, S., Antirandom Testing: Getting the most out of Bask-Vox Testing (Proc. 6th Int. Symp. on Software Reliability Engineering. Toulouse), France, 1995, pp. 86–95.

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Correspondence to S. V. Yarmolik.

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Original Russian Text © S.V. Yarmolik, V.N. Yarmolik, 2011, published in Avtomatika i Vychislitel’naya Tekhnika, 2011, No. 3, pp. 19–30.

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Yarmolik, S.V., Yarmolik, V.N. The synthesis of probability tests with a small number of kits. Aut. Conrol Comp. Sci. 45, 133–141 (2011). https://doi.org/10.3103/S0146411611030072

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