Abstract
In this paper, controlled random tests have been analyzed, and the main criteria used for their synthesis, such as the Hamming distance and the Euclidean distance, have been presented. A method for synthesizing multiple controlled random tests based on the use of the initial random test and addition operation has been proposed. The resulting multiple tests can be interpreted as a single controlled random test. The complexity of its construction is significantly lower than the complexity of the construction of classical random tests. An algorithm for the synthesis of such tests is considered. Examples of tests and estimates of their effectiveness have been presented.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
Rajsuman, R., System-On-A-Chip: Design and Test, London: Artech House Publishers, 2000.
Ivanyuk, A.A., Proektirovanie vstraivaemykh tsifrovykh ustroistv i sistem (Designing Embedded Digital Devices and Systems), Minsk: Best-print, 2012.
Appelo, D., et al., On the automation of the test flow of complex SoCs, Proc. IEEE VLSI Test Symposium (VTS 2006), Berkeley: USA, 2006.
Petersen, K., Oberg, J., and Magnhagen, B., Towards an almost C-testable NoC test strategy, Proc. East-West Design and Test Symposium (EWDTS'07), Kharkov: Ukraine, 2007, pp. 126–132.
Anand, S., et al., An orchestrated survey on automated software test case generation, J. Syst. Software, 2014, vol. 39, no. 4, pp. 582–586.
Malaiya, Y.K. and Yang, S., The coverage problem for random testing, Proc. IEEE ITC, Las Vegas, USA, 1984, pp. 237–242.
Chen, T.Y., Kuo, F.-C., Merkel, R.G., and Tse, T.H., Adaptive random testing: The ART of test case diversity, J. Syst. Software, 2010, vol. 83, no. 1, pp. 60–66.
Yarmolik, S.V. and Yarmolik, V.N., Synthesis of probability tests with a small number of sets, Avtom. Vychisl. Tekh., 2011, no. 3, pp. 19–30.
Zhou, Z.Q., Using coverage information to guide test case selection in adaptive random testing, Proc. 34th IEEE Comp. Soft. and Applications Conf., 2010, pp. 208–213.
Sahari, M.S., A’ain, A.K., and Grout, I.A., Scalable antirandom testing (SAT), Int. J. Innov. Sci. Modern Eng., 2015, vol. 3, no. 4, pp. 33–35.
Mrozek, I. and Yarmolik, V.N., Iterative antirandom testing, J. Electron. Test., Theory Appl., 2012, vol. 9, no. 3, pp. 251–266.
Mrozek, I. and Yarmolik, V.N., Antirandom test vectors for BIST in hardware/software systems, Fundamenta Informaticae, 2012, vol. 119, no. 2, pp. 1–23.
Yarmolik, C.V. and Yarmolik, V.N., Multiple nondestructive march tests with variable address sequences, Avtom. Telemekh., 2007, no. 4, pp. 126–137.
Yarmolik, S.V. and Yarmolik, V.N., Controlled random testing, Informatika, 2011, no. 1, pp. 79–88.
Yarmolik, S.V. and Yarmolik, V.N., Controlled probabilistic tests, Avtom. Telemekh., 2012, no. 10, pp. 142–155.
Huang, R., Chen, J., and Lu, Y., Adaptive random testing with combinatorial input domain, Sci. World J., 2014, vol. 2014, pp. 1–16.
Chen, T.Y., Huang, D.H., and Zhou, Z.Q., On adaptive random testing through iterative partitioning, J. Inf. Sci. Eng., 2011, vol. 27, pp. 1449–1472.
Yarmolik, S.V., Zankovich, A.P., and Ivanyuk, A.A., Marshevye testy dlya samotestirovaniya OZU (Marching Tests for RAM Self-Testing), Minsk: Izdatel’skii tsentr BGU, 2009.
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © V.N. Yarmolik, I. Mrozek, S.V. Yarmolik, 2015, published in Avtomatika i Vychislitel’naya Tekhnika, 2015, No. 6, pp. 101–113.
About this article
Cite this article
Yarmolik, V.N., Mrozek, I. & Yarmolik, S.V. Controlled method of random test synthesis. Aut. Control Comp. Sci. 49, 395–403 (2015). https://doi.org/10.3103/S0146411615060115
Received:
Published:
Issue Date:
DOI: https://doi.org/10.3103/S0146411615060115