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Title: Design and Challenges of Edge Computing ASICs on Front-End Electronics

Journal Article · · Proceedings of the IEEE International Symposium on Quality Electronic Design (ISQED)
 [1];  [1];  [1];  [1];  [2];  [1];  [1];  [1];  [1]
  1. Brookhaven National Laboratory (BNL), Upton, NY (United States)
  2. University of South Florida, Tampa, FL (United States)

In situ or hardware-embedded data processing of raw signals, close to their source, in radiation detectors is expected to provide dramatic improvements in data quality and volumes. However, the implementation of artificial neural networks (ANNs) in the front-end electronics, and the design of custom integrated circuits (ASICs), comes with challenges. In addition, detectors have to operate with limited power budget and implement complex functionalities in a very dense space. They often are exposed to extreme conditions as they work in high-radiation environments and/or cryogenic temperatures. This paper presents examples of applications and design methodologies for in-situ ANNs, along with the challenges of retaining the fidelity of the trained networks. For illustration, we use the problem of estimating the energy deposited by the radiation from digitized waveforms. The proposed implementation starts with an ML algorithm trained in Qkeras and eventually leads to an equivalent ASIC implementation. The associated design challenges in realizing energy and area efficient implementations in CMOS processes are reviewed. Novel approaches that employ hybrid technologies (combination of CMOS with memristors), in-memory computing models, and bio-inspired spiking neural networks are also highlighted

Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Laboratory Directed Research and Development (LDRD) Program
Grant/Contract Number:
SC0012704
OSTI ID:
1906165
Report Number(s):
BNL-223813-2022-JAAM
Journal Information:
Proceedings of the IEEE International Symposium on Quality Electronic Design (ISQED), Vol. 2022; Conference: 2022 23. International Symposium on Quality Electronic Design (ISQED), Santa Clara, CA (United States), 6-7 Apr 2022; ISSN 1948-3287
Publisher:
IEEECopyright Statement
Country of Publication:
United States
Language:
English

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