In Situ Transmission Electron Microscopy: Signal processing challenges and examples

Kacher, Josh; Xie, Yao; Voigt, Sven P.; Zhu, Shixiang; Yuchi, Henry; Key, Jordan; Kalidindi, Surya R.

doi:10.1109/msp.2021.3119284

Title: In Situ Transmission Electron Microscopy: Signal processing challenges and examples

Journal Article · Tue Dec 28 00:00:00 EST 2021 · IEEE Signal Processing Magazine

DOI:https://doi.org/10.1109/msp.2021.3119284· OSTI ID:1874003

Kacher, Josh ^[1]; Xie, Yao ^[1]; Voigt, Sven P. ^[1]; Zhu, Shixiang ^[1]; Yuchi, Henry ^[1]; Key, Jordan ^[1]; Kalidindi, Surya R. ^[1]

Georgia Inst. of Technology, Atlanta, GA (United States)

Transmission electron microscopy (TEM) is a powerful tool for imaging material structure and characterizing material chemistry. Recent advances in data collection technology for TEM have enabled high-volume and high-resolution data collection at a microsecond frame rate. Here, taking advantage of these advances in data collection rates requires the development and application of data processing tools, including image analysis, feature extraction, and streaming data processing techniques. In this article, we highlight a few areas in materials science that have benefited from combining signal processing and statistical analysis with data collection capabilities in TEM and present a future outlook on opportunities of integrating signal processing with automated TEM data analysis.

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Research Organization:: Georgia Institute of Technology, Atlanta, GA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division; National Science Foundation (NSF)

Grant/Contract Number:: SC0018960

OSTI ID:: 1874003

Journal Information:: IEEE Signal Processing Magazine, Vol. 39, Issue 1; ISSN 1053-5888

Publisher:: IEEECopyright Statement

Country of Publication:: United States

Language:: English

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